UTP CRIS Expert
Index
Log in
Search form
Menu
Home
People
Organizations
Research
Accurate modeling method to evaluate reliability of nanoscale circuits
Conference Paper
http://dx.doi.org/10.1109/edssc.2012.6482862
Overview
Identity
View All
Overview
authors
Singh, N. S. S.
Hamid, Nor Hisham bin
Asirvadam, Vijanth Sagayan A/L
publication date
2012
Identity
Digital Object Identifier (DOI)
https://doi.org/10.1109/edssc.2012.6482862
