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Enhanced Trench Shielded Power UMOSFET for Single Event Burnout Hardening
Conference Paper
http://dx.doi.org/10.1109/rsm46715.2019.8943495
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authors
Krishnamurthy, Saranya
Kannan, Ramani
Hussin, Fawnizu Azmadi Bin
Yahya, Erman Azwan
publication date
2019
Identity
Digital Object Identifier (DOI)
https://doi.org/10.1109/rsm46715.2019.8943495
