On using IEEE 1500 standard for functional testing Conference Paper

http://dx.doi.org/10.1109/asqed.2013.6643561

authors

Ali, Ghazanfar
Hussin, Fawnizu Azmadi Bin
Ali, Noohul Basheer Zain
Hamid, Nor Hisham bin

publication date

2013

Digital Object Identifier (DOI)

https://doi.org/10.1109/asqed.2013.6643561